• Springer
  • 2020
  • 0
  • English
  • Udgave er ikke defineret
  • 9783662083963
0

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.